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In depth Raman analysis of the ferroelectrics KTiOPO4 and LiNbO3 : role of domain boundaries and defects / Michael Rüsing ; Supervisor: Prof. Dr. Artur Zrenner. Paderborn, 2018
Inhalt
Table of contents
1 Introduction
2 Material systems
2.1 LiNbO3 and LiTaO3
2.1.1 Crystal structure and crystal growth
2.1.2 Intrinsic and extrinsic defects in LiNbO3 and LiTaO3
2.2 KTiOPO4-family
3 Methods
3.1 Introduction to Raman spectroscopy
3.1.1 Classical approach
3.1.2 Quantum mechanical description
3.2 Experimental Instrumentation
3.2.1 Confocal Raman imaging
3.2.2 Second-Harmonic Microscopy
3.3 Selected experimental applications
3.3.1 Investigation of cubic GaN
3.3.2 Second harmonic microscopy of c-AlN on 3C-SiC
3.3.3 Domain imaging in thin film LiNbO4
3.3.4 Depth correction in microscopy
4 Spectroscopic analysis
4.1 LiNbO3 and LiTaO3
4.1.1 Phonons in the LiNbO3 system
4.1.2 Theoretical calculation of Raman Spectra
4.1.3 LiNb(1-x)TaxO3 mixed crystals
4.1.4 Conclusion
4.2 KTiOPO4 family
4.3 Directional dependent Raman spectroscopy
5 Imaging Spectroscopy
5.1 Unraveling the DW contrast mechanism in Raman spectroscopy
5.1.1 Raman Imaging and Directional dispersion
5.1.2 Domain walls on y-cut surfaces
5.1.3 Atomistic simulations
5.1.4 Limits and open questions
5.1.5 Summary and Conclusion
5.2 Investigation of KTiOPO4
5.2.1 Rb-exchanged waveguides in KTiOPO4
5.2.2 Perdiodically poled Rb-exchanged waveguides
6 Conclusion
List of figures
List of tables
References
Appendix A KTP wafer homogeneity
Appendix B Investigation of y-cut PPKTP
Appendix C Publication list
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